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Title:
PARTICLE COUNTER
Document Type and Number:
Japanese Patent JP2010151811
Kind Code:
A
Abstract:

To provide a particle counting apparatus capable of judging the stain state of a light transmitting window with high sensitivity.

The particle counting apparatus includes a light source 281 for irradiating a measuring target region 40 in a vacuum state or a close vacuum state with a light through a light incident window 24; a scattered light detector 32 for detecting the scattered light which occurs by irradiating the measuring target region 40 with light, through a detection window 30; a vacuum gauge 12 for measuring the degree of vacuum of the measuring target region 40; a signal processing part 13 for converting a scattered light detection signal to an electrical signal; and a stain discriminating part 19 for discriminating the stain state of the light-transmitting window from the time average value of the electrical signal and the degree of vacuum.

COPYRIGHT: (C)2010,JPO&INPIT


Inventors:
ARAKAWA AKIRA
MORI TAKAHIRO
INOUE MUNEHIRO
Application Number:
JP2009269333A
Publication Date:
July 08, 2010
Filing Date:
November 26, 2009
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N15/06
Domestic Patent References:
JP2008224689A2008-09-25
JP2008157648A2008-07-10
JPH02208531A1990-08-20
JP2002196075A2002-07-10
JPH0626823A1994-02-04
JPH09269293A1997-10-14
JPH1114541A1999-01-22
JPH0429866U1992-03-10
JPH072970U1995-01-17
JPS61286758A1986-12-17
Foreign References:
WO2007012878A12007-02-01
Attorney, Agent or Firm:
Kyoto International Patent Office