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Title:
PARTICLE SIZE DISTRIBUTION MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP3895673
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To reduce noise scattered light, which causes noise by an extremely simple structure in a dynamic scattering type particle size distribution measuring apparatus.
SOLUTION: The particle size distribution measuring apparatus is provided with a transparent cell 2 for housing a sample containing particles to be measured C; a laser light irradiating part 4 for irradiating the sample with laser light from the outside of the cell 2; a scattered light intensity measuring part 5 for measuring the intensity of scattered light emitted from the particles to be measured C irradiated with the laser light; and a computation part 7 for computing a particle size distribution on the basis of fluctuations caused in the intensity of the scattered light by Brownian motion of the particles to be measured C. For reducing the amount of incidence of the noise scattered light onto the scattered light measuring part caused by flaws in the cell 2, the difference between the refractive indices of the cell 2 and ambient air, etc., at least a region in an external wall surface 21a and/or an internal wall surface 21b of the cell irradiated with the laser light is inclined by an prescribed angle with respect to the optical axis of the laser light.


Inventors:
Tetsuji Yamaguchi
Umezawa Makoto
Application Number:
JP2002338627A
Publication Date:
March 22, 2007
Filing Date:
November 21, 2002
Export Citation:
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Assignee:
HORIBA, Ltd.
International Classes:
G01B11/06; G01N15/14; G01N15/02; (IPC1-7): G01N15/02; G01B11/06
Domestic Patent References:
JP2002005813A
JP8178825A
JP6221989A
JP6012942U
JP2212741A
JP62058138A
Attorney, Agent or Firm:
Ryuhei Nishimura



 
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