粒子状物質検出装置及び粒子状物質検出方法

Japanese Patent JP5081897

B2

A particulate matter detection device (100) that detects particulate matter contained in gas includes a collection electrode (1) that collects the particulate matter, a discharge electrode (2) that allows a corona discharge (10) to occur when a voltage is applied between the collection electrode (1) and the discharge electrode (2), a measurement electrode (5), the impedance between the collection electrode (1) and the measurement electrode (5) changing when the collection electrode (1) has collected the particulate matter, and a measurement section (3) that detects a change in the impedance between the collection electrode (1) and the measurement electrode (5), the particulate matter detection device detecting the particulate matter by charging the particulate matter contained in the gas by utilizing the corona discharge (10), collecting the charged particulate matter by the collection electrode (1) by utilizing an electrostatic force, and detecting a change in the impedance between the collection electrode (1) that has collected the particulate matter and the measurement electrode (5) using the measurement section (3). The particulate matter detection device and a particulate matter detection method using the particulate matter detection device can simply detect particulate matter with a small measurement error.

Ken Sakuma
Fujioka Yasumasa
Atsushi Kondo

JP2009504096A

November 28, 2012

March 14, 2008

Click for automatic bibliography generation  

Nippon Insulator Co., Ltd.

G01N27/02; G01N27/60; G01N27/68

JPS61195462U	1986-12-05
JPH0216445A	1990-01-19
JP2004170287A	2004-06-17
JP2003315244A	2003-11-06
JPS60144945U	1985-09-26
JPS61142451A	1986-06-30
JPS63286753A	1988-11-24

Ippei Watanabe
Koji Kikawa
Chongqing Sugano
Hiroyuki Sato
Shigeru Koike

Previous Patent: JPS5081896

Next Patent: 補間画像生成方法及びシステム