Title:
PATTERN AREA RATIO MEASURING SYSTEM
Document Type and Number:
Japanese Patent JPH04297813
Kind Code:
A
Abstract:
PURPOSE:To obtain a pattern area ratio measuring system to be built in a print processing system. CONSTITUTION:An automatic developing system 2 is coupled through a carrying system 3 with a pattern area ratio measuring system. When a form plate is set in the auto-feeder 1 in the developing system 2, developing and measurement of area ratio are carried out automatically. The auto-feeder 1 comprises a shelf section 11 having multi-stage shelves containing every sheet of form plate and a mechanism for vertically moving the shelf section 11 to align any one stage of shelf with the carrying path of the automatic developing system and for inserting a form plate contained in the shelf into the automatic developing system.
Inventors:
SUGIMURA SHINJI
YOSHIDA MASAKICHI
TOZAWA SHINICHI
YOSHIDA MASAKICHI
TOZAWA SHINICHI
Application Number:
JP8580591A
Publication Date:
October 21, 1992
Filing Date:
March 27, 1991
Export Citation:
Assignee:
TOPPAN PRINTING CO LTD
International Classes:
B41M1/06; B41F31/02; G01B11/28; (IPC1-7): B41M1/06; G01B11/28
Attorney, Agent or Firm:
Takehiko Suzue