Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PATTERN GENERATING METHOD
Document Type and Number:
Japanese Patent JPS6128950
Kind Code:
A
Abstract:

PURPOSE: To decrease the number of processes by applying a photosensitive resin onto the surface of an object to be worked, exposing and developing a part of the applied part, and thereafter, exposing and developing the unexposed part, and thereafter, etching the object to be worked.

CONSTITUTION: A positive type photoresist is supplied onto the surface of an object to be worked, and thereafter, only an alignment mark forming part 3 is exposed by a desired mark pattern, and subsequently, developed by a developer, and an alignment mark 4 of a photoresist is formed on the surface of an object to be worked 1. Subsequently, based on this alignment mark 4 as a reference, a part of 5 of the unexposed part is exposed by a desired pattern, next, the object to be worked 1 is moved, and based on the alignment mark 4 as a reference, the remaining unexposed part 6 is exposed by a desired pattern. Subsequently, a development and an etching are executed, the photoresist is peeled off, and a long-sized pattern 7 is formed. In such a way, washing of a substrate, applying the photoresist, etching and peeling of the photoresist are executed only once, and the process is shortened, therefore, the yield is improved.


Inventors:
SUZUKI HIDEYUKI
TERADA KATSUNORI
MASAKI YUICHI
MORIMOTO KENJI
Application Number:
JP14966084A
Publication Date:
February 08, 1986
Filing Date:
July 20, 1984
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
CANON KK
International Classes:
G03F7/00; C23F1/00; G03F7/20; G03F9/00; (IPC1-7): C23F1/00
Attorney, Agent or Firm:
Yamashita



 
Previous Patent: Imaging device

Next Patent: ANCHOR