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Title:
PATTERN INSPECTION DEVICE
Document Type and Number:
Japanese Patent JPS6149281
Kind Code:
A
Abstract:

PURPOSE: To process with high speed and to reduce a memory by scanning a memory in parallel corresponding to scanning of a picture memory.

CONSTITUTION: A picture memory 1 stores a certain object pattern 0B and for this, two inspection areas A and B are set. Standard patterns A' and B' corresponding to respective inspection areas A and B are stored in a standard pattern memory 2. Then respective kinds of data are stored in standard data memory 4. The data give instructions to a scanning controller 3 to that a prescribed area (A and B) of a memory 1 and a prescribed standard pattern (A' and B') of a memory 2 can be mutually read corresponding each other. By designating a scan starting point and the area, a prescribed relation between the memories 1 and 2 is preserved and the contents can be taken out. At an operation circuit 5, concerning respective data which are read from the memories 1 and 2, for example, matching can be obtained by "and" operation.


Inventors:
OKI KOICHI
HORII HIROYUKI
Application Number:
JP17044584A
Publication Date:
March 11, 1986
Filing Date:
August 17, 1984
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G06T1/00; G06K9/00; (IPC1-7): G06K9/00
Domestic Patent References:
JPS4888815A1973-11-21
JPS5748163A1982-03-19
Attorney, Agent or Firm:
Namiki Akio