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Title:
PATTERNED LIGHT PROJECTING APPARATUS AND METHOD
Document Type and Number:
Japanese Patent JP2012202803
Kind Code:
A
Abstract:

To compensate, in a three-dimensional shape measuring apparatus which projects a light pattern onto an object by scanning a light beam with a vibrating mirror, for variations attributable to the environmental conditions of the projected light pattern among other factors.

The timings at which a slit light ray scanned by a MEMS mirror 14 passes an end A of the effective scanning range are detected with an optical fiber 20A and an optical detector 36A. A time interval measuring unit 38 measures the time intervals between the timings at which the slit light ray subjected to reciprocating scans passes the end A. A scanning angle determining unit 40 figures out a scanning angle variation pattern matching the measured time intervals, and figures out from the pattern a scanning angle matching the phase of a laser drive signal. A modulation pattern signal generating unit 42 figures out from a projection pattern a laser beam emission intensity matching the scanning angle that has been figured out. A laser drive circuit 32 controls beam emission by a laser 10 in accordance with the laser beam emission intensity that has been figured out.


Inventors:
SATO YUKIO
SHIBATA SUSUMU
NISHIYAMA NAOKI
NISHIO HIROSHI
Application Number:
JP2011067270A
Publication Date:
October 22, 2012
Filing Date:
March 25, 2011
Export Citation:
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Assignee:
SPACE VISION:KK
International Classes:
G01B11/25; G02B26/10
Domestic Patent References:
JPH11160434A1999-06-18
JP2009258089A2009-11-05
JP2010066598A2010-03-25
JP2010079198A2010-04-08
JP2008197206A2008-08-28
Foreign References:
WO2009063986A12009-05-22
Attorney, Agent or Firm:
Patent Corporation yki International Patent Office