Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PERFORMANCE EXAMINING METHOD FOR CIRCUIT BREAKER TRIP RESISTOR
Document Type and Number:
Japanese Patent JPH04290976
Kind Code:
A
Abstract:

PURPOSE: To provide a synthetic testing method for a circuit breaker of resistor cutoff, type, with which the influence of hot gas generated in the main cutoff part upon the interpolar insulation recovering characteristic of the resistor shutoff part can be examined with a power supply having a capacity as satisfactorily used in usual synthetic tests.

CONSTITUTION: For the winding ratio of a transformer 5 and the output voltage of a current source shortcircuiting power generator, a reactor 1 is used as capable of supplying a certain specific cutoff current to the main cutoff part 9, and the resistance value of a resistor 10 relative to these circuit constants is such as capable of supplying specific cutoff current to a resistor cutoff part 11. The resistance value of this resistor is changed appropriately according to the power supply capacity for synthetic tests, and thereby a synthetic testing method for a resistor cutoff type circuit breaker as per invention is achieved, in which the configuration remains in moderate size and with which the performance can be examined using a power supply of a capacity applicable satisfactorily to usual synthetic tests.


Inventors:
OSHITA YOICHI
KASHIMURA KATSUICHI
HASHIMOTO TAKESHI
KOYANAGI OSAMU
KUROSAWA YUKIO
Application Number:
JP5630991A
Publication Date:
October 15, 1992
Filing Date:
March 20, 1991
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
G01R31/327; G01R31/333; (IPC1-7): G01R31/32
Attorney, Agent or Firm:
Katsuo Ogawa