位相特性測定装置 - Hamamatsu Photonics Co., Ltd.

Title:

位相特性測定装置

Document Type and Number:

Japanese Patent JP4296070

Kind Code:

B2

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Inventors:

Urakami Tsuneyuki
Shinichiro Qingdao
Haruyasu Ito
Hideki Hashimoto

Application Number:

JP2003343638A

Publication Date:

July 15, 2009

Filing Date:

October 01, 2003

Export Citation:

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Assignee:

Hamamatsu Photonics Co., Ltd.

International Classes:

G01J9/00; G01J11/00

Domestic Patent References:

JP3226632A
JP2003337309A

Other References:

IEEE Journal of Quantum Electronics,1999年 4月,Vol.35 No.4,p.501~509
光学,(社)応用物理学会分科会日本光学会,2001年12月10日,第30巻第12号,p.834~844
Optics Letters,1999年 9月15日,Vol.24 No.18,p.1314~1316

Attorney, Agent or Firm:

Yoshiki Hasegawa
Shiro Terasaki
Satoru Ishida
Masatoshi Shibata

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