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Title:
PHASE INFORMATION DETECTION METHOD AND PHASE INFORMATION DETECTOR
Document Type and Number:
Japanese Patent JP2008224364
Kind Code:
A
Abstract:

To provide a phase information detection method and a phase information detector, capable of acquiring easily phase information of a phase object in real time, without using an expensive phase-contrast microscope.

Light from an image of the phase object is passed through an objective lens having a chromatic aberration, and is image-focused thereafter in a different position depending on a wavelength of the light. A plurality of picked-up images is obtained by picking up the image of the phase object in a position with an equal distance from the objective lens, as to the plurality of wavelengths different each other. The plurality of picked-up images is image-processed to obtain the phase information of the phase object. Brightness is corrected in the image processing, as to each of the plurality of picked-up images, to obtain a plurality of brightness-corrected images. A difference between the brightness-corrected images is found to obtain a brightness difference image as the phase information.


Inventors:
OJI OSAMU
Application Number:
JP2007061783A
Publication Date:
September 25, 2008
Filing Date:
March 12, 2007
Export Citation:
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Assignee:
KAWASAKI HEAVY IND LTD
International Classes:
G01N21/27; G01J9/00; G06T1/00
Domestic Patent References:
JP2005257567A2005-09-22
JP2004113708A2004-04-15
JP2006317406A2006-11-24
JP2002305632A2002-10-18
Attorney, Agent or Firm:
Patent business corporation Yuko patent office