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Patent Searching and Data


Title:
PHASE SHIFT MASK AND METHOD FOR MANUFACTURING PHASE SHIFT MASK
Document Type and Number:
Japanese Patent JP2005257962
Kind Code:
A
Abstract:

To improve dimensional difference between line width L1 of a resist pattern formed as depending on exposure light transmitting through an engraved groove as a phase shifter, and line width L2 of a resist pattern formed depending on the exposure light transmitting through other transparent region, without inducing collapse or peeling of the light shielding pattern.

The mask comprises: a transparent substrate 1 having two regions transmitting exposure light and having a recessed portion which inverts the phase of the exposure light transmitting one region, the recessed portion formed in the other region; and a light shielding film 2 blocking the exposure light, the film formed in such a manner that the film has a plurality of film thicknesses and that the end of the film does not cover the recessed part.


Inventors:
WATANABE KUNIO
Application Number:
JP2004068302A
Publication Date:
September 22, 2005
Filing Date:
March 11, 2004
Export Citation:
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Assignee:
SEMICONDUCTOR LEADING EDGE TEC
International Classes:
G03F1/30; G03F1/58; G03F1/68; G03F7/20; G03F9/00; H01L21/027; (IPC1-7): G03F1/08; G03F7/20; H01L21/027
Domestic Patent References:
JPH08314117A1996-11-29
JP2004029081A2004-01-29
JP2000267255A2000-09-29
JP2002156741A2002-05-31
JP2001305714A2001-11-02
JP2000081696A2000-03-21
Foreign References:
US20030003376A12003-01-02
Attorney, Agent or Firm:
Masahiko Hinataji
Mitsuyuki Matsuyama