To improve dimensional difference between line width L1 of a resist pattern formed as depending on exposure light transmitting through an engraved groove as a phase shifter, and line width L2 of a resist pattern formed depending on the exposure light transmitting through other transparent region, without inducing collapse or peeling of the light shielding pattern.
The mask comprises: a transparent substrate 1 having two regions transmitting exposure light and having a recessed portion which inverts the phase of the exposure light transmitting one region, the recessed portion formed in the other region; and a light shielding film 2 blocking the exposure light, the film formed in such a manner that the film has a plurality of film thicknesses and that the end of the film does not cover the recessed part.
JPH08314117A | 1996-11-29 | |||
JP2004029081A | 2004-01-29 | |||
JP2000267255A | 2000-09-29 | |||
JP2002156741A | 2002-05-31 | |||
JP2001305714A | 2001-11-02 | |||
JP2000081696A | 2000-03-21 |
US20030003376A1 | 2003-01-02 |
Mitsuyuki Matsuyama
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