Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PHOTOELECTRON SPECTROSCOPY DEVICE
Document Type and Number:
Japanese Patent JPS5934136
Kind Code:
A
Abstract:

PURPOSE: To make a sufficient photoelectron spectroscopy in a minute region of a sample possible, by providing a means which varies the section of an electron beam, an aperture which changes the size of an X-ray passage hole, and a displacing means which displaces a target relatively.

CONSTITUTION: A thermoelectron flux E from a filament 1 is shaped by an electron shaping lens 5 to give such size to the section of the thermoelectron flux E that the quantity of X rays required for analysis is generated. For the purpose of cutting X rays around X rays, which have the section having a prescribed size, from an X-ray target 2 by an aperture 7, U-shaped plates 7A and 7B are moved properly in X and Y directions by an aperture moving mechanism 8.


Inventors:
SHIMOMURA TAKAYUKI
Application Number:
JP14407082A
Publication Date:
February 24, 1984
Filing Date:
August 20, 1982
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NIPPON ELECTRON OPTICS LAB
International Classes:
G01N23/227; G01N23/225; H01J37/252; (IPC1-7): G01N23/227; H01J37/252