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Title:
フォトマスクブランクの製造方法及びフォトマスクの製造方法
Document Type and Number:
Japanese Patent JP4318561
Kind Code:
B2
Abstract:

To manufacture a high-quality photomask blank having extremely little defect by easily and reliably removing a foreign matter or the like depositing on the surface of a light transmitting substrate (the principal surface and the end faces comprising side faces and chamfered faces).

The method for manufacturing a photomask blank includes: cleaning the surface of a transparent substrate 1; and then forming a thin film as a transfer pattern to be transferred to a transfer material on the surface of the transparent substrate, wherein the surface of the transparent substrate is cleaned by carrying out surface improvement process to improve wettability of the surface of the transparent substrate by using, for example, a UV irradiation apparatus, and then the end faces of the surface of the transparent substrate are cleaned by using an end face cleaning apparatus, afterward the principal surface is subjected to at least one of scrub cleaning by using a cleaning tool, two-fluid spray cleaning by using a two-fluid spray nozzle 13, ultrasonic cleaning by using a ultrasonic cleaning nozzle 14, or the like.

COPYRIGHT: (C)2005,JPO&NCIPI


Inventors:
Ryo Goto
Osamu Hanaoka
Application Number:
JP2004031789A
Publication Date:
August 26, 2009
Filing Date:
February 09, 2004
Export Citation:
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Assignee:
HOYA CORPORATION
International Classes:
B08B1/04; B08B3/02; B08B3/04; B08B7/04; G03F1/50; G03F1/82
Domestic Patent References:
JP63249146A
JP63271938A
JP2000966A
JP3029474B2
JP4109247A
JP4298747A
JP6084857A
JP6301193A
JP10062965A
JP11231508A
JP11265870A
JP2000330262A
JP2002082426A
JP2002131884A
JP2002201042A
JP2003316107A
JP2004251995A
Other References:
吉田幸造,洗浄・ウェット処理技術,'90年薄膜応用電子デバイス,1990年 2月 5日,M3D5,P139-147
Attorney, Agent or Firm:
Aniya Setsuo
Toru Yui
Hitoshi Kiyono



 
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