Title:
PHOTOMASK BLANK AND METHOD OF MANUFACTURING PHOTOMASK BLANK
Document Type and Number:
Japanese Patent JP2002169265
Kind Code:
A
Abstract:
To provide a method of manufacturing a photomask blank which lessens the warpage of a substrate by film stress (relieves the film stress) and improves the density and denseness of the films.
The method of manufacturing the photomask blank by forming the light shielding films or light translucent films on a transparent substrate comprises forming the light shielding films or light translucent films by depositing the light shielding films or light translucent films by a sputtering method on the substrate 6 and simultaneously irradiating the film materials under deposition on the substrate 6 with the ions formed by an ion former (hereafter an ion source 11) separately included in a deposition chamber.
Inventors:
KUREISHI MITSUHIRO
NOZAWA JUN
NOZAWA JUN
Application Number:
JP2000367837A
Publication Date:
June 14, 2002
Filing Date:
December 01, 2000
Export Citation:
Assignee:
HOYA CORP
International Classes:
C23C14/00; C23C14/34; C23C14/48; G03F1/50; G03F1/54; H01L21/027; (IPC1-7): G03F1/08; C23C14/48; H01L21/027
Domestic Patent References:
JPH03105344A | 1991-05-02 | |||
JPH0915831A | 1997-01-17 | |||
JPH11316454A | 1999-11-16 | |||
JPH08225936A | 1996-09-03 | |||
JPH05158216A | 1993-06-25 |
Attorney, Agent or Firm:
Yasuo Fujimura
Previous Patent: PHOTOMASK AND METHOD OF MANUFACTURING FOR THE SAME
Next Patent: MASK, IMAGING CHARACTERISTIC MEASURING METHOD AND EXPOSURE METHOD
Next Patent: MASK, IMAGING CHARACTERISTIC MEASURING METHOD AND EXPOSURE METHOD