PURPOSE: To provide both a threshold voltage when a liquid crystal is started to rise and electrostatic capacity when the liquid crystal is brought into an enough rise state.
CONSTITUTION: In a liquid crystal physical property measuring method wherein the change of electrostatic capacity is measured as a voltage is applied on a liquid crystal orientated between a pair of orientation films, by using an orientation film on which rubbing is applied, the change of electrostatic capacity of a liquid crystal is measured as a voltage is applied. By using an orientation film on which no rubbing is applied, the change of electrostatic capacity of a liquid crystal is measured as a voltage is applied on the liquid crystal, and the physical properties of a liquid crystal are obtained from the two measuring results. In a substrate for measuring the physical properties of a liquid crystal, rubbing is the first part of the orientation film of the substrate, and no rubbing is applied on a second part different from the first part of the orientation film.
YOSHIDA HIDESHI
NAKAMURA KIMIAKI
