Title:
物理量計測装置および物理量計測方法
Document Type and Number:
Japanese Patent JP4908637
Kind Code:
B2
Abstract:
It is possible to rapidly or highly accurately estimate a highly reliable offset according to situations and improve further the reliability of the estimated offset even if a measurement data is not obtained in a space in which the magnitude of a vector physical quantity to be measured is uniform. The offset included in the obtained vector physical quantity data are statistically estimated based on a predetermined evaluation formula using a difference vectors. In the estimation of the offset, reliability information on a reference point is calculated based on at least one of the vector physical quantity data, the difference vectors and a plurality of estimated reference points according to a calculation parameter for calculating the reliability information on the reference point, whether or not the reference point is reliable is determined by comparing the reliability information with a determination threshold value, and the reference point determined to be reliable is output as an offset included in vector physical quantity data determined by a data acquisition portion.
Inventors:
Toru Kitamura
Norihiko Mikoshiba
Norihiko Mikoshiba
Application Number:
JP2010539154A
Publication Date:
April 04, 2012
Filing Date:
November 20, 2009
Export Citation:
Assignee:
Asahi Kasei Electronics Co., Ltd.
International Classes:
G01C17/38; G01P21/00
Domestic Patent References:
| JPH05215553A | 1993-08-24 | |||
| JP2006226810A | 2006-08-31 | |||
| JP2005195376A | 2005-07-21 | |||
| JP2006337057A | 2006-12-14 | |||
| JP2005249619A | 2005-09-15 |
Foreign References:
| WO2005003683A1 | 2005-01-13 |
Attorney, Agent or Firm:
Patent Business Corporation Tani/Abe Patent Office