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Title:
PHYSICAL QUANTITY MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP2001116626
Kind Code:
A
Abstract:

To reduce a production cost and improve a yield by eliminating a mechanically movable part from a wavelength detection part.

This physical quantity measuring system detects reflection light from one or more optical fiber Bragg gratings FBG1-FBG10 formed in an optical fiber allowing incidence of measurement light to measure a physical quantity in each position of the optical fiber Bragg gratings FBG1-FBG10. The reflection light from the respective optical fiber Bragg gratings FBG1-FBG 10 is made incident on waveguide Bragg gratings WBG1-WBG10 each allowing a change of a reflection wavelength according to at least two control voltages, reflection light caused by the waveguide Bragg gratings WBG1-WBG10 is made incident on a photodiode, and a wavelength of each the reflection light from the optical fiber Bragg gratings FBG1-FBG10 is measured on the basis of a logarithm of a ratio of photoelectric currents according to the respective control voltages.


Inventors:
SANO YASUKAZU
Application Number:
JP29686599A
Publication Date:
April 27, 2001
Filing Date:
October 19, 1999
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G01L1/24; G01K11/12; G01L11/00; G01L11/02; (IPC1-7): G01K11/12; G01L1/24; G01L11/02
Attorney, Agent or Firm:
Yuichi Morita