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Title:
プラント点検計画最適化装置及び方法
Document Type and Number:
Japanese Patent JP7251950
Kind Code:
B2
Abstract:
A plant inspection planning optimization apparatus includes: a plant operation estimation unit that estimates the variation of the operation of a plant; a degradation probability distribution estimation unit that estimates the probability distributions of the degradations of plural inspection-scheduled points of the plant with the use of the variation of the operation of the plant and the degradation state and the probability distribution of the parameter of an estimation model obtained at the previous inspection; an inspection point optimization unit that selects inspection points selected from the inspection-scheduled points in accordance with a selection index with the use of the probability distributions of the degradations of the plural inspection-scheduled points; and an output unit that provides the selected inspection points and inspection techniques.

Inventors:
Kazuo Mutou
Application Number:
JP2018211303A
Publication Date:
April 04, 2023
Filing Date:
November 09, 2018
Export Citation:
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Assignee:
株式会社日立製作所
International Classes:
G06Q10/20; G05B23/02; G06Q10/04
Domestic Patent References:
JP7078022A
JP2008191900A
JP2016177682A
JP2016004523A
JP2017187900A
JP2017081685A
Attorney, Agent or Firm:
Polar Patent Attorney Corporation