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Title:
PLASMA PROCESSING DEVICE
Document Type and Number:
Japanese Patent JPH08148473
Kind Code:
A
Abstract:

PURPOSE: To provide a plasma processing device which is equipped with a shielding plate that is less deformed and produces less contaminants.

CONSTITUTION: A plasma processing device is equipped with a reaction chamber 4 where reactive gas is turned plasmatic by microwaves 2, a wafer processing chamber 7 which processes the surface of at semiconductor wafer 8, and a insulating shielding plate 5 which separates the reaction chamber 4 from the processing chamber 7. The insulating shielding plate 5 prevents ions generated from plasmatic reactive gas from penetrating into the reaction chamber 4 but introduces radicals generated from plasmatic reactive gas into the reaction chamber 4, and furthermore, a mesh provided to the insulating shielding plate 5 is replaced with a finer mesh, whereby ions are stopped from passing through the insulating shielding plate 5. A quartz plate is used as a shielding plate which hardly contaminates the reaction chamber, and a composite shielding plate, which is composed of an aluminum plate and a quartz plate, not only grounds ions but also protects the reaction chamber against contamination and enables the aluminum plate to absorb ions that pass through the shielding plate. By a heater installed inside the wafer processing chamber 7, plasma processing is carried out at a high reaction speed without causing damage to a work.


Inventors:
KOBAYASHI AKIRA
Application Number:
JP30541594A
Publication Date:
June 07, 1996
Filing Date:
November 15, 1994
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
C30B25/02; C23C16/50; C23C16/511; H01L21/302; H01L21/3065; H05H1/46; (IPC1-7): H01L21/3065; C23C16/50; C30B25/02
Domestic Patent References:
JPH02197122A1990-08-03
JPH04225226A1992-08-14
JPH0729885A1995-01-31
Attorney, Agent or Firm:
Toshi Takemura