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Patent Searching and Data


Title:
PLASMA TRACE ELEMENT MASS SPECTROMETER
Document Type and Number:
Japanese Patent JPH03261062
Kind Code:
A
Abstract:

PURPOSE: To reduce the power consumption of a mass spectrometer and miniaturize the spectrometer and reduce the cost of the spectrometer by setting the degree of vacuum of a first actuation area to less than 1Torr.

CONSTITUTION: Samples are introduced into atmospheric pressure plasma 10 generated in the area (I) of atmospheric pressure on a plasma generating system so that the samples are ionized. The sample ions are expanded and diffused in the area (II) of 1 to 10-3Torr via a plasma sampling system 70 and an ion beam composed of the sample ions, etc., is formed by an ion takeout system provided in the area (III) of 10-4 to 10-5Torr and consisting of an ion takeout electrode 80 and an ion accelerating electrode 90, etc. The ion beam is transported via an ion transporting system 100 to a mass spectrometry system 110 provided in the area (IV) of 10-6 to 10-7Torr and the samples are identified by an ion detecting system 120.


Inventors:
OKAMOTO YUKIO
SHIMURA SOJI
Application Number:
JP5635990A
Publication Date:
November 20, 1991
Filing Date:
March 09, 1990
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01N27/62; H01J49/10; H01J49/24; H01J49/28; (IPC1-7): G01N27/62; H01J49/24; H01J49/28
Attorney, Agent or Firm:
Katsuo Ogawa (1 person outside)