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Title:
PLATE AND METHOD FOR MEASURING RESIDUAL THICKNESS OF REFRACTORY MATERIAL
Document Type and Number:
Japanese Patent JP2010190463
Kind Code:
A
Abstract:

To provide a plate and method for measuring the residual thickness of a refractory material, capable of inexpensively, easily and accurately measuring the residual thickness of the refractory material installed on an inner wall of a melting furnace at a large number of measuring points.

The plate 1A for measuring the residual thickness to measure the residual thickness of the refractory material 5 of the melting furnace in which the refractory material 5 is arranged on the inner wall 13 is embedded in and fixed to the refractory material 5 arranged on the wall 13. By using a correspondence relationship between the length of an exposure part 4 of the plate 1A exposed due to wear of the refractory material 5 and the residual thickness h of the refractory material 5, the residual thickness h of the refractory material 5 is measured.


Inventors:
OGASAWARA TORU
Application Number:
JP2009033735A
Publication Date:
September 02, 2010
Filing Date:
February 17, 2009
Export Citation:
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Assignee:
MITSUI SHIPBUILDING ENG
International Classes:
F27D21/00; F27B1/14; F27B1/28; F27B3/14; F27B3/28; F27D1/00
Domestic Patent References:
JPH03211390A1991-09-17
JPH0285997U1990-07-06
JPS3810000B1
Attorney, Agent or Firm:
Shinichi Ogawa
Takashi Noguchi
Kazuhiko Saishita



 
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