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Title:
PLATE WAVE INSPECTION METHOD AND DEVICE
Document Type and Number:
Japanese Patent JP2014178289
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To achieve a plate wave inspection device executing a long distance inspection even in a plate to be inspected having an R part and a step part and capable of improving a detection sensitivity.SOLUTION: A probe 3 is moved up above the upper part of a test part 1 for calibration having the same shape and quality of material as an object 10 to be inspected, and a rotating stage 5 is adjusted. The probe 3 scans a reflection source of the test part 1 for calibration, calculates a relationship between a propagation time and a defect position and the relationship between the propagation time and a detection sensitivity, and corrects data obtained by inspecting the object 10 to be inspected using the calculated relationships. Thereby, even the object 10 to be inspected having the R part and the step part can be subjected to a long distance inspection, and a water immersion plate wave inspection device for executing a plate wave inspection capable of improving detection sensitivity can be achieved.

Inventors:
MIZOTA HIROHISA
NAGASHIMA YOSHIAKI
SHIBAHARA KEISUKE
YOSHIDA MASAHIRO
Application Number:
JP2013054091A
Publication Date:
September 25, 2014
Filing Date:
March 15, 2013
Export Citation:
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Assignee:
HITACHI GE NUCLEAR ENERGY LTD
International Classes:
G01N29/04
Domestic Patent References:
JPS63167266A1988-07-11
JP2009236620A2009-10-15
JP2013002822A2013-01-07
JP2006242741A2006-09-14
JPS63167266A1988-07-11
JP2009236620A2009-10-15
JP2013002822A2013-01-07
JP2006242741A2006-09-14
Attorney, Agent or Firm:
Kasuga 讓
Ino tree Yuichi