Title:
SURFACE DEFECT INSPECTING DEVICE
Document Type and Number:
Japanese Patent JP3189588
Kind Code:
B2
Abstract:
PURPOSE: To closely inspect an object to be inspected for surface defect by providing an image pickup means which converts a received light image into image data, bright- and-dark pattern discriminating means which discriminates the brightness and darkness of the image by processing the image data, bright-and-dark area processing means which enlarges obtained bright areas and dark areas, image emphasizing means, defect detecting means, etc.
CONSTITUTION: A camera control unit 4 generates the image signal of a received light image picked up with a video camera 2 and outputs the image signal to an image processor 5. The processor 5 performs a bright-and-dark pattern discriminating process, image emphasizing process, image area process, and defect detecting process on the original image. In order to recognize stripes from the original image, low-frequency components are extracted from the original image and binarized as a threshold to the original image and the brightness and darkness of the stripes are separated and extracted. In the image emphasizing process, signals from which only defective components are removed by smoothing are subtracted from the original image signal so as to offset the low-frequency and stripe components. In the defect detecting process, the image-emphasized results and bright-and-dark pattern discriminated results are ANDed so that only defects can be surely detected.
Inventors:
Masanori Imanishi
Honami Syoyo
Chinori Nousou
Honami Syoyo
Chinori Nousou
Application Number:
JP22056894A
Publication Date:
July 16, 2001
Filing Date:
September 14, 1994
Export Citation:
Assignee:
Nissan Motor Co., Ltd
International Classes:
G01B11/30; G01N21/88; (IPC1-7): G01B11/30; G01N21/88
Domestic Patent References:
| JP6330749A | ||||
| JP1134207U |
Attorney, Agent or Firm:
Junnosuke Nakamura (1 outside)