Title:
偏光解析装置
Document Type and Number:
Japanese Patent JP4950234
Kind Code:
B2
Abstract:
A thin polarizer array and a wavelength plate array that are composed of micro regions having different optical axis directions and wavelength characteristics and have a high extinction ratio and a low insertion loss, and a polarization analyzer using them are disclosed. An array of micro periodic grooves is formed on a substrate, with the directions changed from one region to another. An alternating multilayer film formed by alternating a layer of high refractive index material such as Si or Ta2O5 and a layer of low refractive index material such as SiO2 is formed by bias sputtering. By selecting a condition that each layer maintains its periodic projecting/recessed shape, an array of photonic crystal polarizer is formed. By mounting this array of photonic crystal polarizer in a photodetector array, a polarization analyzer that is small, has no movable part, is composed of a small number of components, and enables high-precision measurement is constituted.
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Inventors:
Shojiro Kawakami
Nao Sato
Takayuki Kawashima
Osamu Ishikawa
Nao Sato
Takayuki Kawashima
Osamu Ishikawa
Application Number:
JP2009025700A
Publication Date:
June 13, 2012
Filing Date:
February 06, 2009
Export Citation:
Assignee:
Limited company auto cloning technology
International Classes:
G02B5/30; G01J4/04; G02B27/28
Domestic Patent References:
| JP4294264B2 | ||||
| JP2002116085A | ||||
| JP11211654A | ||||
| JP2000056133A | ||||
| JP2001051122A |
Attorney, Agent or Firm:
Takayuki Hirose