POLARIZATION CHANGE SPECTRUM MEASURING DEVICE, POLARIZATION CHANGE SPECTRUM MEASURING METHOD, MAGNETO-OPTICAL EFFECT MEASURING DEVICE AND MAGNETO-OPTICAL EFFECT MEASURING METHOD

Title:

POLARIZATION CHANGE SPECTRUM MEASURING DEVICE, POLARIZATION CHANGE SPECTRUM MEASURING METHOD, MAGNETO-OPTICAL EFFECT MEASURING DEVICE AND MAGNETO-OPTICAL EFFECT MEASURING METHOD

Document Type and Number:

Japanese Patent JP2013137209

Kind Code:

A

Abstract:

To shorten a time required for measuring wavelength dependence of an angle change of a plane of polarization in a material.

A magneto-optical effect measuring device 10 comprises: a white light source 1 for generating white light; a polarizer 2 for forming linearly polarized light from the white light and making the linearly polarized light incident on a sample S; an electromagnet for applying a magnetic field to the sample S; an analyzer 5 on which detection light emitted from the sample S is made incident; a spectrometer 7 on which a passed light passed through the analyzer 5 is made incident; an optical sensor 8 for detecting respective light intensities of wavelength components with different wavelengths obtained by splitting light by the spectrometer 7; and an arithmetic unit 9 for calculating wavelength dependence of magneto-optical characteristics of the sample S from respective light intensities of the detected wavelength components.

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Inventors:

MEGURO SAKAE
SAITO SHIN
DU GUAN-XIANG
TAKAHASHI KEN

Application Number:

JP2011287570A

Publication Date:

July 11, 2013

Filing Date:

December 28, 2011

Export Citation:

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Assignee:

NEOARK CORP
UNIV TOHOKU

International Classes:

G01J3/447; G01J4/04; G01N21/21; G02B5/30

Domestic Patent References:

JP2010271068A	2010-12-02
JPH0534273A	1993-02-09
JPS63122930A	1988-05-26
JPH09145605A	1997-06-06
JPH0372202A	1991-03-27
JP2003149050A	2003-05-21

Other References:

JPN6016014350; 芳野俊彦　ほか: 'ファラデーセルを用いた磁気光学効果測定装置' 生産研究第３５巻，第１１号, 198311, 第４９７-５００頁

Attorney, Agent or Firm:

Minoru Kudo

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