Title:
POLARIZATION DEPENDENCY PRECISION MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP3403643
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To measure polarization dependency even when there are ripples by matching the linear polarization plane of natural emission light and the linear polarization plane perpendicular to it with the TE direction and TM direction of a measured element respectively.
SOLUTION: The light passing through a 1/2-wavelength plate 105 is incident to a measured element 120 by a spherical-tip fiber 119, the output light from the measured element 120 is extracted by a spherical-tip fiber 121 and is incident to a light spectrum analyzer 122. The light spectrum analyzer 122 manually or automatically rotates a fiber 104 by trial and error so that the difference between the TE light and TM light becomes maximum while monitoring the incident light, thereby the linear polarization plane B of the measured element 120 is matched with the TE direction, the linear polarization plane C perpendicular to the polarization plane B is matched with the TM direction, and the spectrum is measured at this time.
Inventors:
Toshio Ito
Naoto Yoshimoto
Naoto Yoshimoto
Application Number:
JP20834098A
Publication Date:
May 06, 2003
Filing Date:
July 23, 1998
Export Citation:
Assignee:
Nippon Telegraph and Telephone Corporation
International Classes:
G01M11/02; H04B10/00; H04B10/07; H04B10/25; (IPC1-7): G01M11/02; H04B10/00
Domestic Patent References:
| JP5313082A | ||||
| JP7243940A |
Attorney, Agent or Firm:
Yoshikazu Tani (1 person outside)