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Title:
POLISHING DEVICE
Document Type and Number:
Japanese Patent JP3803130
Kind Code:
B2
Abstract:

PURPOSE: To provide a polishing device which can effectively prevent pollution and can be installed in a clean room.
CONSTITUTION: A polishing device is provided with a loading and unloading block 7 to deliver a cassette housing a wafer, a carrying block 8 to move the wafer from the cassette, a polishing block 6 to polish the wafer, a cleaning block 9 to clean and dry the wafer after it is polished and a control block 10 to control operation of the device, and has a wall plate on the periphery and the ceiling so as to cover the whole of these, and is constituted in a box shape. According to this polishing device, a semiconductor wafer is polished by the polishing block 6, and the polished semiconductor wafer is transferred to the cleaning block 9 from the polishing block. The semiconductor wafer is cleaned and dried. Therefore, the semiconductor wafer is taken out of the polishing device in a cleaned and dried condition.


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Inventors:
Toyomi Nishi
Tetsuji Togawa
Yajima Hiroumi
Kazuaki Hinata
Shoichi Kodama
Yukio Imoto
Riichiro Aoki
Masako Watase
Atsushi Shigeta
Shiro Mishima
Yoshisuke Kono
Application Number:
JP34479795A
Publication Date:
August 02, 2006
Filing Date:
December 06, 1995
Export Citation:
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Assignee:
Ebara Corporation
Toshiba Corporation
International Classes:
B23Q11/00; H01L21/304; B24B37/00; B24B37/04; B24B55/06; (IPC1-7): B24B37/00; B23Q11/00; B24B55/06; H01L21/304
Domestic Patent References:
JP1144639A
JP647657A
JP3274746A
JP3184331A
Attorney, Agent or Firm:
Isamu Watanabe
Shintaro Hotta