Title:
研磨装置、および研磨パッドの交換時期を決定する方法
Document Type and Number:
Japanese Patent JP7421460
Kind Code:
B2
Abstract:
The present invention relates to a technique of determining a time to replace a polishing pad used in a polishing apparatus for polishing a workpiece, such as wafer, substrate, or panel. A polishing apparatus (1) includes: a polishing table (5) configured to support a polishing pad (2); a polishing head (7) configured to press a workpiece (W) against a polishing surface (2a) of the polishing pad (2); a dresser (40) configured to dress the polishing surface (2a) of the polishing pad (2); a detection sensor (60) configured to detect friction between the dresser (40) and the polishing pad (2), the detection sensor (60) being fixed to the dresser (40); and a wear monitoring device (63) configured to determine a wear index value from a plurality of output values of the detection sensor (60) and generate an alarm signal when the wear index value is smaller than a predetermined lower limit.
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Inventors:
Yuta Suzuki
Taro Takahashi
Hiroshi Otaki
Tsuneo Torigoe
Hiroaki Nishida
Taro Takahashi
Hiroshi Otaki
Tsuneo Torigoe
Hiroaki Nishida
Application Number:
JP2020163274A
Publication Date:
January 24, 2024
Filing Date:
September 29, 2020
Export Citation:
Assignee:
Ebara Corporation
International Classes:
B24B49/18; B24B49/10; B24B53/00; B24B53/017; H01L21/304
Domestic Patent References:
JP2010226007A | ||||
JP2005022028A | ||||
JP2020028955A | ||||
JP2014042968A | ||||
JP2006255851A | ||||
JP2017100254A | ||||
JP2009255250A |
Foreign References:
KR1020200043216A |
Attorney, Agent or Firm:
Tetsuya Hirosawa
Isamu Watanabe
Goto Manabu
Mitsuhiro Kanazawa
Isamu Watanabe
Goto Manabu
Mitsuhiro Kanazawa
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