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Patent Searching and Data


Title:
POLISHING OF SEMICONDUCTOR WAFER
Document Type and Number:
Japanese Patent JPH0911112
Kind Code:
A
Abstract:

PURPOSE: To provide a method of polishing a semiconductor wafer which can separate the semiconductor wafer from an upper surface table and retain the semiconductor on a lower surface table when the upper surface table is lifted in double-side polishing.

CONSTITUTION: The contact area of an upper surface plate 3 and a semiconductor wafer 1 is set smaller than that of a lower surface table 5 and the semiconductor wafer 1. When the upper surface 3 is lifted up, the semiconductor wafer 1 is stayed on the lower surface table 5 side to be surely separated from an emery cloth 2 on the upper surface wafer 3.


Inventors:
HAJIME TAKAFUMI
SASHITANI TOSHIJI
Application Number:
JP19898195A
Publication Date:
January 14, 1997
Filing Date:
June 30, 1995
Export Citation:
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Assignee:
KOMATSU DENSHI KINZOKU KK
International Classes:
B24B29/00; B24D11/00; H01L21/304; (IPC1-7): B24B29/00; B24D11/00; H01L21/304
Attorney, Agent or Firm:
Akira Saito