Title:
POLYMER ANALYSIS DEVICE AND POLYMER ANALYSIS METHOD
Document Type and Number:
Japanese Patent JP2005300480
Kind Code:
A
Abstract:
To provide a device capable of efficiently analyzing a polymer by changing a part to be cut to obtain various fragments and perform mass analysis of them, for performing mass analysis by cutting the polymer.
This polymer analysis device comprises a wavelength-variable infrared laser output part, an ion trap part holding an ionized sample, and a mass analysis part performing mass analysis of the sample held by the ion trap part. The laser outputted from the infrared laser output part is radiated to the sample held by the ion trap part, and the sample is cut by the radiated laser.
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Inventors:
TAKAHASHI KATSUTOSHI
FUKUI KAZUHIKO
FUKUI KAZUHIKO
Application Number:
JP2004120804A
Publication Date:
October 27, 2005
Filing Date:
April 15, 2004
Export Citation:
Assignee:
NAT INST OF ADV IND & TECHNOL
International Classes:
G01N27/62; H01J49/38; (IPC1-7): G01N27/62