To provide a poor contact measuring method and a poor contact measurement determination device, capable of measuring existence of a poor contact while a male terminal and a female terminal are connected to each other.
In the poor contact measuring method and a poor contact measurement determination device, an electromagnetic wave La capable of penetrating housings 110, 118 is irradiated from the outside of the housings 110, 118 of a coupler unit 100 to the male terminal 108 and the female terminal 116 under a current conduction state; intensity of a first reflected wave as a reflected wave Lb of the electromagnetic wave La to the male terminal 108 and intensity of a second reflected wave as the reflected wave Lb of the electromagnetic wave La to the female terminal 116 are detected; and existence of generation of a potential difference between the male terminal 108 and the female terminal 116 on the basis of a difference of the intensity of the first reflected wave and the second reflected wave.
Toshiyuki Miyadera
Shuji Ouchi
Next Patent: POOR CONTACT MEASURING METHOD AND POOR CONTACT MEASURING DEVICE