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Patent Searching and Data


Title:
POSE MEASUREMENT DEVICE, METHOD AND PROGRAM
Document Type and Number:
Japanese Patent JP2017096656
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To improve measurement accuracy of a pose of a measured object by a focusing method in a pose measurement device, method and program.SOLUTION: A pose measurement device measuring a pose of a measured object by a focusing method comprises a control device that causes a camera to take a plurality of pieces of images as changing a focus position in an optical axis direction of a variable focus lens in a periphery around the measured object. The control device is configured to calculate an index value that represents a focus state of a plurality of division areas where each image is formed as to the plurality of pieces of images; obtain one piece of the image including mutually different two division areas having top two values highest in a fixed change rate in which, of the corresponding division areas of the plurality of pieces of images, the index value exceeds a threshold and the index value changes exceeding the fixed change rate with respect to the index value in other corresponding division areas, and calculate an inclination orthogonal to the optical axis and with mutually orthogonal two axes as a center from heights at two points along the optical axis direction in the mutually different division areas of the one piece of the image.SELECTED DRAWING: Figure 8

Inventors:
INOTANI NOBUHIKO
NISHIYAMA YOJI
ABE TAKAYUKI
SAKAI SATORU
Application Number:
JP2015225972A
Publication Date:
June 01, 2017
Filing Date:
November 18, 2015
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01B11/26; G01B11/00; G02B7/28; G03B13/36; G06T7/00; H04N5/232
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Takao Kato