Title:
ポテンショメータの劣化診断方法
Document Type and Number:
Japanese Patent JP5843663
Kind Code:
B2
Abstract:
In a method for evaluating degradation of a potentiometer, a plurality of evaluation items, from minor to major, are established as evaluation items for degradation in performance prior to failure of a potentiometer. The degradation of the potentiometer in performance of the plurality of evaluation items is evaluated in terms of stages, in a specific sequence.
Inventors:
Ryo Saruwatari
Hiroaki Narita
Takuji Abe
Hiroaki Narita
Takuji Abe
Application Number:
JP2012048483A
Publication Date:
January 13, 2016
Filing Date:
March 05, 2012
Export Citation:
Assignee:
Azbil Co., Ltd.
International Classes:
G01D5/165; G01D18/00; G01R17/20; G01R31/00; G01R31/50
Domestic Patent References:
| JP7095081B2 | ||||
| JP11133082A |
Attorney, Agent or Firm:
Masaki Yamakawa
Shigeki Yamakawa
Shigeki Yamakawa
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