Title:
【発明の名称】インサーキット試験装置
Document Type and Number:
Japanese Patent JP3228982
Kind Code:
B2
Abstract:
Disclosed is a system that determines whether input and output pins of semiconductor components (506, 508, 510) are present and properly soldered to a printed circuit board (500). The system includes an oscillator (518) which is connected to a metallic electrode (502, 503, 504) placed on top of an integrated circuit package (506, 508, 510). A probe pin (512) in a bed of nails tester is connected to a current measuring device (520) and connected to a printed circuit board wiring trace that is soldered to the pin being tested. The oscillator signal is capacitively coupled through the integrated circuit package to the pin being tested, so if current is measured by the current measuring device, the pin is connected to the printed circuit board.
Inventors:
Uger Shillingiro Grou
Application Number:
JP35492191A
Publication Date:
November 12, 2001
Filing Date:
December 20, 1991
Export Citation:
Assignee:
AGILENT TECHNOLOGIES, INC.
International Classes:
G01R31/02; G01R31/04; G01R31/312; G01R31/28; (IPC1-7): G01R31/28; G01R31/02
Attorney, Agent or Firm:
Kaoru Furuya (2 outside)