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Title:
PRE-CHARGING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
Document Type and Number:
Japanese Patent JPS6452282
Kind Code:
A
Abstract:

PURPOSE: To attain a high speed reading operation following a writing operation by starting pre-charging with a pulse produced from a write enable signal before pre-charging with a pulse produced from an address fluctuation detector.

CONSTITUTION: When a writing operation is changed to a reading operation, N channel MOS transistors 16 and 17 are turned ON by a pulse WE produced by a write enable signal and a bit line BL and the inverse BL are charged to specified levels. Then, the bit line BL and the inverse BL are completely pre-charged in transistors 11 to 13 which respond to a pulse inversion EQ produced from an address fluctuation detector (ATD). Transistors 14 and 15 are always turned ON by high resistance and a current for compensating for the leaked amount from the bit line during a long cycle is supplied. Thus, by performing pre-charging in two stages, a high speed for a reading operation following a writing operation is attained.


Inventors:
BIYUN YUN KIMU
TE SUN JIYUN
SAN KI WAN
Application Number:
JP15368888A
Publication Date:
February 28, 1989
Filing Date:
June 23, 1988
Export Citation:
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Assignee:
SAMSUNG SEMICONDUCTOR TELE
International Classes:
G11C11/41; G11C11/40; G11C11/419; (IPC1-7): G11C11/34
Domestic Patent References:
JPS61190787A1986-08-25
Attorney, Agent or Firm:
Takeshi Takatsuki



 
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