Title:
PRESCALER IC TEST METHOD AND PRESCALER IC TEST DEVICE
Document Type and Number:
Japanese Patent JP2715927
Kind Code:
B2
Abstract:
PURPOSE: To easily, accurately determine good or no good of a prescaler IC by inputting a sine wave signal generated in a previously set subharmonic frequency region in the prescaler IC.
CONSTITUTION: A wafer-state prescaler IC 14 is put on a probe card 12 for testing on which a specified wiring pattern 13 is formed. A functional test is conducted between the IC 14 and an IC tester 11 by giving and receiving a d.c. signal through the wiring pattern 13. A sine wave generating circuit 1 on the card 12 generates a sine wave signal in a subharmonic frequency region concerning the IC 14 previously set with d.c. current control voltage 5, and a BPF 2 filters the sine wave signal in a specified region and transfers to the IC 14. A pulse width converting circuit 3 converts the sine wave output signal from the IC 14 into previously set pulse width. An average value voltage detecting circuit 4 detects a d.c. average value of a pulse width conversion output signal. The IC tester 11 determines good or no good of the IC 14 based on the average value voltage signal.
Inventors:
High Yu Nono
Application Number:
JP20980894A
Publication Date:
February 18, 1998
Filing Date:
September 02, 1994
Export Citation:
Assignee:
NEC
International Classes:
G01R1/073; G01R31/28; G01R31/30; G01R31/316; G01R31/319; G01R31/26; H01L21/66; (IPC1-7): G01R31/26; G01R1/073; G01R31/319; H01L21/66
Domestic Patent References:
| JP1194432A |
Other References:
トランジスタ技術編集部「実用電子回路ハンドブック（３）」（１９９０年３月２０日，第１８版発行）ＣＱ出版社 Ｐ．１１９−１２６
Attorney, Agent or Firm:
Yosuke Goto (2 outside)