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Title:
PRESSURE ANALYSIS SYSTEM
Document Type and Number:
Japanese Patent JP2008232665
Kind Code:
A
Abstract:

To provide a pressure analysis system of an inexpensive constitution capable of using a scanner in addition to a dedicated scanner.

The pressure analysis system 1 uses a conversion table of density values and pressure values indicating the relation between lightness values and pressure values acquired by reading pressure measuring films by a reference scanner to convert lightness values acquired by reading pressure measuring films by a scanner other than the reference scanner into pressure values. The pressure analysis system 1 is provided with a calibration sheet 18 for calibrating lightness values acquired by reading the pressure measuring films by the scanner other than the reference scanner; a calibration coefficient preparation means for preparing a calibration coefficient for calibration using values acquired by reading the calibration sheet by the scanner other than the reference scanner; and a scanner value calibration means for calibrating lightness values acquired by reading the pressure measuring films by the scanner other than the reference scanner through the use of the calibration coefficient.


Inventors:
TANIMOTO YUZO
CHIKAMI NOZOMI
YANAGIMOTO TAKEKAZU
SAKAMOTO TADASHI
Application Number:
JP2007069259A
Publication Date:
October 02, 2008
Filing Date:
March 16, 2007
Export Citation:
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Assignee:
FUJIFILM CORP
International Classes:
G01L25/00
Domestic Patent References:
JPH06207868A1994-07-26
JP2002262007A2002-09-13
JPH04350532A1992-12-04
JPH01180431A1989-07-18
JP2004093377A2004-03-25
JP2003050176A2003-02-21
JPH0526700A1993-02-02
JP2006319820A2006-11-24
JP2002156718A2002-05-31
JP2004050723A2004-02-19
JP2004192629A2004-07-08
JPS61150710A1986-07-09
JP2004361232A2004-12-24
JPH11316525A1999-11-16
JP2006298570A2006-11-02
Attorney, Agent or Firm:
Kenzo Matsuura



 
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