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Patent Searching and Data


Title:
PROBE ASSEMBLY
Document Type and Number:
Japanese Patent JPH05297020
Kind Code:
A
Abstract:

PURPOSE: To obtain a probe assembly which can easily confirm the positional relationship between a probe and a position to be inspected and at the same time inspect a plurality of positions to be inspected by one inspection process.

CONSTITUTION: The title body contains a printed circuit board 12 made of an electrically insulated material and a plurality of probes 14 which are laid out on the printed circuit board with a space and the printed circuit board is provided with a plurality of holes which are extended with spaces one another and penetrate the printed circuit board in its thickness direction. Each probe is located at a part between adjacent holes of the printed circuit board, penetrates the printed circuit board in the thickness direction, and also is bent so that the tip part 24 reaches a position which opposes the holes.


Inventors:
ARAKAWA TAKUYA
Application Number:
JP12797392A
Publication Date:
November 12, 1993
Filing Date:
April 22, 1992
Export Citation:
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Assignee:
NIPPON MICRONICS
International Classes:
G01R1/073; G01R31/28; H01L21/66; (IPC1-7): G01R1/073; G01R31/28; H01L21/66
Attorney, Agent or Firm:
Matsunaga Nobuyuki