Title:
PROBE CARD WITH OPTICAL TRANSMISSION MEANS AND MEMORY TESTER
Document Type and Number:
Japanese Patent JP2009128358
Kind Code:
A
Abstract:
To provide a probe card with an optical transmission means and a memory tester.
The probe card includes: two or more needles connected to test terminals formed in a memory; two or more first terminals connected to the needles; two or more second terminals connected to the outside and corresponding to the first terminals; and the optical transmission means connecting the first terminals and the second terminals.
Inventors:
SUH SUNG-DONG
HA KYOUNG-HO
KIM SEONG-GU
CHO SOO-HAENG
MIN BOK-KI
RYU HAN-YOUL
HA KYOUNG-HO
KIM SEONG-GU
CHO SOO-HAENG
MIN BOK-KI
RYU HAN-YOUL
Application Number:
JP2008244985A
Publication Date:
June 11, 2009
Filing Date:
September 24, 2008
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD
International Classes:
G01R1/073; G01R31/26; G01R31/28; H01L21/66
Attorney, Agent or Firm:
Masatake Shiga
Takashi Watanabe
Yasuhiko Murayama
Shinya Mitsuhiro
Takashi Watanabe
Yasuhiko Murayama
Shinya Mitsuhiro
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