Title:
PROBE CHIP AND METHOD FOR FIXING THE SAME
Document Type and Number:
Japanese Patent JP2022016381
Kind Code:
A
Abstract:
To fix a probe chip to a DUT without damaging a test target device (DUT).SOLUTION: A base part 118 of a leg part 116 is fixed on a DUT 101 in a position other than a test point 106 of the DUT 101. A probe chip 100 is arranged near the test point 106, and a connection point 107 of a signal route part 104 of the probe chip 100 is electrically connected to the test point 106. A pole member 119 of a leg part 116 is inserted in a hole 113 of an attachment tab 105 extending away from the signal route part 104, and an adhesive 114 is applied to the member. The adhesive 114 is cured and the probe chip 100 is fixed to the DUT 101.SELECTED DRAWING: Figure 1
Inventors:
JULIE A CAMPBELL
Application Number:
JP2021113369A
Publication Date:
January 21, 2022
Filing Date:
July 08, 2021
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R1/04; G01R1/06; G01R31/26
Attorney, Agent or Firm:
Yamaguchi International Patent Office
Previous Patent: Drive encoder system
Next Patent: Autonomous vehicles, systems, and how autonomous vehicles operate
Next Patent: Autonomous vehicles, systems, and how autonomous vehicles operate