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Title:
PROBE FOR LIGHT DETECTION OR RADIATION AND ITS MANUFACTURE AND SCANNING PROBE MICROSCOPE EQUIPPED WITH PROBE
Document Type and Number:
Japanese Patent JPH11352134
Kind Code:
A
Abstract:

To provide a probe for light detection or radiation in which a minute opening can be formed with excellent repeatability, even in the case of a minute opening having an opening size of 100 nm or less, and to provide its manufacturing method.

This probe for light detection or radiation is composed by exposing a transmissive film 2 from a minute opening 3 formed on a shielding member 1, and has such a characteristic that a projection 5, having a convex shape against a main face of the shielding member 1, is formed by the film 2 exposed from the minute opening 3. This manufacturing method of the probe is a manufacturing method of a probe for light detection or radiation by exposing the film 2 from a minute opening 3 formed on the shielding member 1, and has at least a process in which the shielding member 1 and the film 2 are formed by junction, and a process in which the minute opening 3, from which a part of the film 2 is exposed, is formed by abrading and removing a part of the shielding member 1.


Inventors:
KAWASAKI TAKEHIKO
YAGI TAKAYUKI
SHIMADA YASUHIRO
Application Number:
JP17393398A
Publication Date:
December 24, 1999
Filing Date:
June 05, 1998
Export Citation:
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Assignee:
CANON KK
International Classes:
G01B11/30; G01N37/00; G01Q60/18; G01Q60/22; (IPC1-7): G01N37/00; G01B11/30
Attorney, Agent or Firm:
Tatsuya Nagao



 
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