Title:
PROBE PIN AND INSPECTION JIG USING THE SAME
Document Type and Number:
Japanese Patent JP2017058205
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a probe pin and an inspection jig using the same capable of inspecting an object to be inspected even with little installation space for the inspection jig above the object to be inspected.SOLUTION: A probe pin 15 has a conductive plunger 16 and a coil spring 50 which is disposed winding the periphery of the plunger 16. Particularly, the plunger 16 has a plunger body 31 which has a hook-like shape protruding from one end of the coil spring 50 and a terminal 41 protruding from the other end of the coil spring 50. A first contactor 34 disposed at the front end of the plunger body 31 and the second contactor 46 disposed at the front end of the terminal 41 is oriented in an identical direction.SELECTED DRAWING: Figure 14
Inventors:
TERANISHI HIROSANE
SAKAI TAKAHIRO
KONDO MAKOTO
SAKAI TAKAHIRO
KONDO MAKOTO
Application Number:
JP2015182128A
Publication Date:
March 23, 2017
Filing Date:
September 15, 2015
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01R1/067; G01R31/26; H01R13/24; H01R33/76
Domestic Patent References:
| JP2008047352A | 2008-02-28 | |||
| JP2008516398A | 2008-05-15 | |||
| JP2013511039A | 2013-03-28 | |||
| JPWO2011161855A1 | 2013-08-19 | |||
| JPS60111284U | 1985-07-27 | |||
| JP2007163463A | 2007-06-28 |
Foreign References:
| US20110014823A1 | 2011-01-20 | |||
| WO2014167693A1 | 2014-10-16 |
Attorney, Agent or Firm:
Mitsuo Tanaka
Takuji Yamada
Takanobu Nakajima
Takuji Yamada
Takanobu Nakajima