Title:
プローブピン、検査治具および検査ユニット
Document Type and Number:
Japanese Patent JP7318297
Kind Code:
B2
Abstract:
This probe pin comprises an elastic part capable of elastically deforming along a first direction, a first contact part provided at one first-direction end of the elastic part, and a second contact part provided at the other first-direction end of the elastic part. The first contact part is disposed so as to be removed from the center line of the elastic part in a second direction intersecting the first direction and comprises a plurality of contact-point parts that are disposed at an interval along the second direction. Each of the plurality of contact-point parts becomes farther from the elastic part in the first direction as the contact-point part becomes farther from the center line in the second direction.
Inventors:
Naoya Sasano
Hiroma Teranishi
Takahiro Sakai
Hiroma Teranishi
Takahiro Sakai
Application Number:
JP2019084570A
Publication Date:
August 01, 2023
Filing Date:
April 25, 2019
Export Citation:
Assignee:
Omron Corporation
International Classes:
G01R1/067; H01R13/24
Domestic Patent References:
| JP63025476U | ||||
| JP2017223628A | ||||
| JP2017223629A | ||||
| JP2002134202A | ||||
| JP2015102378A | ||||
| JP2001091537A | ||||
| JP2001147239A | ||||
| JP7115110A |
Foreign References:
| WO2014167693A1 | ||||
| CN107038983A | ||||
| WO2006088131A1 |
Attorney, Agent or Firm:
Takuji Yamada
Mitsuo Wada
Nobunori Iwaki
Mitsuo Wada
Nobunori Iwaki
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