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Title:
PROBE SUPPORT DEVICE
Document Type and Number:
Japanese Patent JP2014087399
Kind Code:
A
Abstract:

To provide a probe support device capable of supporting a probe so that the probe can be positioned approximately directly above a subject region, while keeping costs low.

A probe support device for use includes a base part, an arm part that is connected to an upper end of the base part to be vertically swingable and horizontally rotatable, and a probe support part that is connected to a tip on the side, opposite to a part connected to the base part, of the arm part. The probe support part comprises a deformed part and an undeformed part. The undeformed part is connected to the tip of the arm part in such a manner as to be rotatable with respect to the axis parallel to the axis of rotation when the arm part is vertically swung.


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Inventors:
KAKO WATARU
TAKIZAWA SAKIKO
MOROTA SHIHOKO
KUNO YOSHIKI
NAGAMINE EMI
WATANABE KAZUHIRO
NAKADA TAKESHI
NOGUCHI TAKAHIRO
Application Number:
JP2012237939A
Publication Date:
May 15, 2014
Filing Date:
October 29, 2012
Export Citation:
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Assignee:
CANON KK
International Classes:
A61B8/00
Domestic Patent References:
JP2005312577A2005-11-10
JPH07178097A1995-07-18
JPH0670927A1994-03-15
JPH0584242A1993-04-06
JPH04210051A1992-07-31
JPH0475646A1992-03-10
JPH03188840A1991-08-16
Foreign References:
EP0654244A11995-05-24
Attorney, Agent or Firm:
Kazunobu Sera
Yoshiyuki Kawaguchi
Mayuko Wakuda
Koichiro Sakai
Takeshi Nakamura
Takeshi Niwa



 
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