To provide a probe unit reducing a projection area on a panel surface where a specimen is put on, and a conduction tester using it.

The probe unit 10 is formed with a lead group 14 comprising a plurality of leads 16 bridging over two substrates 12a and 12b. The vicinity of the end part of the lead group 14 from where wires 24 for connecting with a conduction tester body are taken out is formed on the first substrate 12a, and the vicinity of the tip end which contacts the electrode 32 of a specimen 30 is formed on the second substrate 12b. The arrangement intervals of the leads 16 have wider end part side and narrower tip end. By patterning the lead group 14 bridging over the substrates 12a and 12b, the probe unit 10 can be bent at the connection section of the leads 16 and attached to the conduction tester 1, and the projection area of the probe unit 10 on the panel surface where the specimen is put on can be reduced.