PROBE UNIT AND WIRING CHECK SYSTEM

Title:

PROBE UNIT AND WIRING CHECK SYSTEM

Document Type and Number:

Japanese Patent JP2010164406

Kind Code:

A

Abstract:

To provide a probe unit facilitating continuity test on a plurality of terminals of a circuit board.

This probe unit includes a unit plate 72 provided with a plurality of holes corresponding to the plurality of terminals and a plurality of probes 71 slidably mounted in the plurality of holes 73 provided in the unit plate 72. Each of the probes is equipped with a conductive trunk 74 sliding in the hole 73 and a contact mechanism 60 for putting one end of the trunk 74 into contact with a terminal 92. Each contact mechanism 60 comprises a conductive magnet 75 mounted on one end of the trunk 74 and attracting a terminal. Further, it comprises a spring 76 provided around the trunk 74 to press one end of the trunk 74 against the terminal 92.

Inventors:

NAKANO MASAMI

Application Number:

JP2009006531A

Publication Date:

July 29, 2010

Filing Date:

January 15, 2009

Export Citation:

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Assignee:

MICRO SYSTEM KK

International Classes:

G01R31/02

Attorney, Agent or Firm:

Shoji Mizoi

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