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Title:
PROBE AND PROBE UNIT
Document Type and Number:
Japanese Patent JP2010048729
Kind Code:
A
Abstract:

To provide a probe which can be further reduced in size with a uniformed contact pressure.

The probe includes two probe needles 2 and 3, each including a spiral part 2a or 3a formed with the same diameter and the same pitch, a first contact part 2b or 3b formed on one end side of each spiral part 2a or 3a, and a second contact part 2c or 3c formed on the other end side of each spiral part 2a or 3a. The first contact part 2b or 3b and the second contact part 2c or 3c are formed so as to be located within the range of the radius of the spiral part 2a or 3a around axial line L of each spiral part 2a or 3a or less, and the probe needles 2 and 3 are combined to each other with each spiral part 2a or 3a being shifted by half pitch and with the axial line L thereof being matched to each other.


Inventors:
TOMOI TADASHI
Application Number:
JP2008214774A
Publication Date:
March 04, 2010
Filing Date:
August 25, 2008
Export Citation:
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Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01R1/073; G01R1/067; G01R31/26
Domestic Patent References:
JP2003139794A2003-05-14
JP2005091087A2005-04-07
JP2005321211A2005-11-17
JP2002040050A2002-02-06
Attorney, Agent or Firm:
Shinji Sakai