Title:
プローブ及び厚さ測定装置
Document Type and Number:
Japanese Patent JP7245673
Kind Code:
B2
Abstract:
To improve accuracy in evaluation of an object using eddy current.SOLUTION: A probe 1 for inducing an eddy current in an object 9 and measuring the induced eddy current is provided, the probe comprising an excitation coil 3 for inducing an eddy current in an object 9 by means of a magnetic flux generated by an excitation current, a detection coil 4 for detecting the eddy current in the object 9, and a temperature sensor 6 for detecting temperature of the object 9.SELECTED DRAWING: Figure 1
Inventors:
Uzaki Yoshihiko
Application Number:
JP2019039705A
Publication Date:
March 24, 2023
Filing Date:
March 05, 2019
Export Citation:
Assignee:
TLV Co., Ltd.
International Classes:
G01N27/90; G01B7/06
Domestic Patent References:
JP5280921A | ||||
JP2010066115A | ||||
JP2018085224A | ||||
JP2019020320A | ||||
JP55159102A | ||||
JP2018119795A |
Attorney, Agent or Firm:
Kenichi Terazono
Daisuke Kawabe
Daisuke Kawabe
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