Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PRODUCING METHOD FOR SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP3485513
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To reduce production costs and to keep performance and reliability even when the bore of a wafer is enlarged.
SOLUTION: When producing a semiconductor device 40 by applying resin sealed packaging to a wafer 35 having a main surface formed with multiple bumps 34 respectively connected to multiple electrode pads after a wafer process is completed, the producing method is provided with a process for installing and heating a sheet sealing member 36 containing thermosetting resins on the wafer so as to cover the main surface of the wafer, a process for exposing the tops of the bumps by polishing the sheet sealing member after the sheet sealing member is cured, a process for forming a conductive external terminal 38 while connecting it to the bump, and a process for cutting the wafer completely formed with the external terminal and making it into chips. Such heating is performed at the curing temperature of the sheet sealing member.


Inventors:
Yasuo Tanaka
Application Number:
JP2000010676A
Publication Date:
January 13, 2004
Filing Date:
January 19, 2000
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Oki Electric Industry Co., Ltd.
International Classes:
H01L23/12; H01L21/56; H01L23/31; H01L23/485; (IPC1-7): H01L23/12
Domestic Patent References:
JP1079362A
JP982850A
JP11343332A
JP63145323A
JP2001102499A
JP2001144123A
JP2000299333A
Attorney, Agent or Firm:
Kenji Ohnishi