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Title:
PRODUCT CARRIER AND TEST CHAMBER STRUCTURE
Document Type and Number:
Japanese Patent JPH04230877
Kind Code:
A
Abstract:

PURPOSE: To reduce exposure of a part for electrical connection necessary for testing a product to an environment inside a test chamber, i.e., to different temperature and/or humidity inside the chamber.

CONSTITUTION: A product carrier and an environmental test chamber have such structures that the carrier is slid into the chamber to be positioned therein. An introducing wall for the carrier has a stretch port for electrical connection which stretches in the direction of slide of the carrier. The stretch port engages with a part for connection to an external test control circuit and this part is borne on a chamber wall within a route of movement of the carrier, while it is separated from the test chamber itself. The part for connection being present on that wall is not exposed to a test environment inside the chamber.


Inventors:
PIITA EI RIKEN
KEBUIN ERU HAATOUIGU
PIITAA EI MAATEIN
Application Number:
JP6494591A
Publication Date:
August 19, 1992
Filing Date:
March 28, 1991
Export Citation:
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Assignee:
BENCHIYAADAIN LTD
International Classes:
G01R31/30; G01R31/00; (IPC1-7): G01R31/00; G01R31/30
Attorney, Agent or Firm:
Kyozo Yuasa (4 outside)



 
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